Method and circuit for statistical estimation
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United States of America Patent
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Oct 12, 2010
Grant Date -
Mar 22, 2007
app pub date -
Nov 21, 2006
filing date -
Jun 4, 2003
priority date (Note) -
Expired
status (Latency Note)
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Abstract
A method for determining a quality indication, such as a bit error rate or a signal to noise ratio, of a photonic signal is described. The photonic signal is sampled, and then an estimated quality indication, such as the bit error rate, is calculated utilizing statisical analysis of the sampled photonic signal.
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