Self-timed reliability and yield vehicle with gated data and clock
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United States of America Patent
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-
Dec 11, 2007
Grant Date -
Jan 20, 2005
app pub date -
Jul 27, 2004
filing date -
Apr 16, 2003
priority date (Note) -
In Force
status (Latency Note)
Importance
Abstract
A test vehicle a system and method for evaluating an interconnect module manufacturing process while dynamically testing performance with high-speed operational frequencies is disclosed. The test vehicle incorporates a self-timed or gated speed circuit that can detect subtle resistive faults and also show the exact location in the array where the speed fault occurred based on test program data logs from scan flip flops. One embodiment incorporates a gated clock in the gated speed circuit producing gated data that delivers greater statistical properties with respect to Integrated Circuit Direct Drain Quiescent Current (IDDQ) testing.
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