Reducing resistivity in interconnect structures of integrated circuits

Number of patents in Portfolio can not be more than 2000

United States of America Patent

PATENT NO 7919862
APP PUB NO 20070257369A1
SERIAL NO

11429879

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Abstract

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An integrated circuit structure having improved resistivity and a method for forming the same are provided. The integrated circuit structure includes a dielectric layer, an opening in the dielectric layer, an oxide-based barrier layer directly on sidewalls of the opening, and conductive materials filling the remaining portion of the opening.

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Patent Owner(s)

  • TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Huang, Cheng-Lin Hsinchu, TW 115 1262

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