Multi-wavelength optical thermometry

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United States of America Patent

PATENT NO 5263776
SERIAL NO

07951280

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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Multi-wavelength optical thermometry provides for non-contact measurement of the temperature of a sample where the front surface and the back surface of the sample are used in a interferometer to measure changes in optical path length. Laser beams at two different wavelengths are used and the beam phase of the two resultant interference signals is used to unambiguously measure the path length change over a broad temperature range.

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Patent Owner(s)

  • INTERNATIONAL BUSINESS MACHINES CORPORATION

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Abraham, David W Ossining, NY 97 1172
Holber, William M New York, NY 44 2783
Logan, Joseph S Poughkeepsie, NY 20 880
Wickramasinghe, Hemantha K Chappaqua, NY 51 1130

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