Offset calibration of analog-to-digital converters using a spectrum analyzer

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United States of America Patent

PATENT NO 10389374
SERIAL NO

16032754

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Abstract

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Approaches provide for calibrating high speed analog-to-digital converters (ADCs). For example, a calibration signal can be applied to parallel ADCs. The output of the parallel ADCs can be analyzed using a gradient-based optimization approach or other such optimization approach to determine optimized gain error calibration data to compensate for gain mismatch in and between individual parallel time-interleaved ADCs and to determine time-offset calibration data to compensate for timing errors in and between individual parallel time-interleaved ADCs. For example, once a calibration signal is applied to an ADC, the output of the ADC can be analyzed to determine a spectrum of the calibration signal. One or more images (e.g., phasors) of the spectrum can be determined and used to determine initial values of the optimization. Thereafter, the optimization approach can be utilized to determine optimized gain error calibration data and optimized time-offset calibration data, which can be stored and/or used to calibrate individual time-interleaved ADCs.

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Patent Owner(s)

Patent OwnerAddress
ARCTIC SEMICONDUCTOR CORPORATION2216 RINGWOOD AVE SAN JOSE CA 95131

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Khoshgard, Mahdi Los Gatos, US 20 69
Toosi, Vahid M Los Altos, US 12 14
Veyseh, Marzieh Los Altos, US 23 195

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