World-wide distributed testing for integrated circuits
Number of patents in Portfolio can not be more than 2000
United States of America Patent
Stats
-
Mar 6, 2007
Grant Date -
N/A
app pub date -
Jul 29, 2004
filing date -
Jul 29, 2004
priority date (Note) -
In Force
status (Latency Note)
Importance
Abstract
An integrated circuit test method is provided that utilizes shared tester resources physically located at different geographical sites throughout the world to test specific integrated circuits, thereby maximizing utilization of all tester resources and, thereby, dramatically reducing the overall cost to test.
First Claim
Family
International Classification(s)
Cited Art Landscape
Patent Citation Ranking
Advertisement
Advertisement
Advertisement
Recipient Email Address
Recipient Email Address
Comment
Recipient Email Address
Add to Portfolio(s)
To add this patent to one, or more, of your portfolios, simply click the add button.
This Patent is in these Portfolios:
Add to additional portfolios:
Last Refreshed On:
Changes done successfully