Data management platform, intelligent defect analysis system, intelligent defect analysis method, computer-program product, and method for defect analysis

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United States of America Patent

PATENT NO 11797557
APP PUB NO 20220365945A1
SERIAL NO

17438752

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Abstract

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A data management platform for intelligently managing data is provided. The data management platform includes an ETL module configured to extract, cleanse, transform, or load data; a data lake configured to store a first group of data formed by extracting raw data from a plurality of data sources by the ETL module; a data warehouse configured to store a second group of data formed by cleansing and standardizing on the first group of data; a general data layer configured to store a third group of data formed by subjecting the second group of data to data fusion; and a data mart configured to store a fourth group of data formed by transforming the third group of data by the ETL module. The general data layer is a distributed data storage storing information available for querying. The data mart is a database of NoSQL type storing information available for computational processing.

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Patent Owner(s)

  • BOE TECHNOLOGY GROUP CO. LTD.

International Classification(s)

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Bai, Guanchun Beijing, CN 2 1
Lan, Tian Beijing, CN 114 564
Shen, Guoliang Beijing, CN 8 1
Tang, Yue Beijing, CN 19 25
Wang, Hong Beijing, CN 1087 12473
Wang, Jianzhou Beijing, CN 5 1
Wu, Haohan Beijing, CN 11 3
Wu, Jianmin Beijing, CN 26 367
Yuan, Fei Beijing, CN 9 7
Zeng, Yingli Beijing, CN 2 1

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