Tool tips with scanning probe microscopy and/or atomic force microscopy applications
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United States of America Patent
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Aug 11, 2009
Grant Date -
N/A
app pub date -
Sep 12, 2006
filing date -
May 10, 2005
priority date (Note) -
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Abstract
A micro-object is affixed to a mounting structure at a desired relative orientation. The micro-object may be a tool tip optimized to work with particular microscope objectives permitting the tip to be imaged along with the object surface and used to make measurements or modifications through a travel range along the microscope imaging axis equal to or nearly equal to the working distance of the given objective. The tool tip may have a lengths exceeding 80 microns, say up to several millimeters; even the longest tips can have widths of tens of microns.
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