Plasma CVD method

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United States of America Patent

PATENT NO 6951828
SERIAL NO

09917095

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Abstract

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In a process of forming a silicon oxide film 116 that constitutes an interlayer insulating film with TEOS as a raw material through the plasma CVD method, the RF output is oscillated at 50 W, and the RF output is gradually increased from 50 W to 250 W (an output value at the time of forming a film) after discharging (after the generation of O2-plasma). A TEOS gas is supplied to start the film formation simultaneously when the RF output becomes 250 W, or while the timing is shifted. As a result, because the RF power supply is oscillated at a low output when starting discharging, a voltage between the RF electrodes can be prevented from changing transitionally and largely.

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Patent Owner(s)

  • SEMICONDUCTOR ENERGY LABORATORY CO., LTD.

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Hiroki, Masaaki Kanagawa, JP 258 8537
Sakama, Mitsunori Kanagawa, JP 92 2806
Yamazaki, Shunpei Tokyo, JP 7287 226692

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