Test method for determining microstructure deformation resistance of a microstructured film

United States of America Patent

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May 18, 2010
Grant Date
Apr 30, 2009
app pub date
Oct 3, 2008
filing date
Oct 31, 2007

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Abstract

Test method for determining (e.g. prism) microstructure deformation of a microstructured (e.g. brightness enhancing) film are described.

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3M INNOVATIVE PROPERTIES COMPANY

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G01L:MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL ....

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Inventor Name	Address	# of filed Patents	Total Citations
Dreyer, Stephen J	North St. Paul, US	3	7
Dupre, Mark R	Oakdale, US	9	94
Hesselroth, Adam H	Hudson, US	1	0

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Test method for determining microstructure deformation resistance of a microstructured film

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United States of America Patent

12245046

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PATENT NO	7716999
APP PUB NO	20090107261A1
SERIAL NO	12245046
DOCKET NO

US Family Size	Non-US Coverage
Patent Longevity Expired	Forward Citations

DATE PUBLISHED	PUBLICATION/PATENT NO.	PUBLICATION TYPE
May 18, 2010	US,7716999,B2 US7716999B2	GRANTED PATENT AS SECOND PUBLICATION
April 30, 2009	US,20090107261,A1 US20090107261A1	FIRST PUBLISHED PATENT APPLICATION

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12245046

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