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• 15 United States
• 10 France
• 8 Japan
• 7 China
• 5 Korea
• 2 Other

Patent Owner(s)

Patent Owner	Address
CALIFORNIA INSTITUTE OF TECHNOLOGY	1200 E CALIFORNIA BLVD PASADENA CA 91125

International Classification(s)

• G01T:MEASUREMENT OF NUCLEAR OR X-RADIATION

• [Classification Symbol]

• [Patents Count]

Inventor(s)

Inventor Name	Address	# of filed Patents	Total Citations
Hager, Harold	Bellevue, US	3	19
Henry, Michael D	Altadena, US	30	304
Scherer, Axel	Laguna Beach, US	317	7765

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Maintenance Fees

Fee	Large entity fee	small entity fee	micro entity fee	due date
11.5 Year Payment	$7400.00	$3700.00	$1850.00	Jan 3, 2024

Fee	Large entity fee	small entity fee	micro entity fee
Surcharge - 11.5 year - Late payment within 6 months	$160.00	$80.00	$40.00
Surcharge after expiration - Late payment is unavoidable	$700.00	$350.00	$175.00
Surcharge after expiration - Late payment is unintentional	$1,640.00	$820.00	$410.00

DATE PUBLISHED	PUBLICATION/PATENT NO.	PUBLICATION TYPE
July 03, 2012	US,8212217,B2   US8212217B2	GRANTED PATENT AS SECOND PUBLICATION
June 24, 2010	US,20100155602,A1   US20100155602A1	FIRST PUBLISHED PATENT APPLICATION

Full Text

US Patent No: 8212217

Silicon surface state detectors and detector arrays

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