Integrated circuit and method of adjusting capacitance of a node of an integrated circuit

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United States of America Patent

PATENT NO 6867629
SERIAL NO

10247401

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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The present invention relates to an integrated circuit device and method of adjusting capacitance of a node of an integrated circuit In one embodiment, the device comprises a first digital input, a first parasitic capacitance block, a first output, a second digital input, a second parasitic capacitance block and a second output. The first parasitic capacitance block includes an inverter, a variable capacitance element, and a wire capacitance element. The first parasitic capacitance block has a capacitance that is a function of the first digital input. The first output is responsive to the first parasitic capacitance block, and the second output is responsive to the second parasitic capacitance block. In a particular embodiment, the method includes selecting a logic state of a digital input; applying the digital input to a parasitic capacitance block having an output, the output having a first capacitance when the digital input is in first logic state and a second capacitance when the digital input is in a second logic state; and adjusting a capacitance with respect to a second circuit node within the integrated circuit by applying the output to the second circuit node.

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Patent Owner(s)

  • SUN MICROSYSTEMS, INC.

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Bosnyak, Robert J San Jose, CA 56 882
Drost, Robert J Mountain View, CA 140 1795

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