Method for performing IR spectroscopy measurements to determine film coating thickness on a substrate
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United States of America Patent
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Aug 3, 2010
Grant Date -
Feb 11, 2010
app pub date -
Aug 8, 2008
filing date -
Aug 8, 2008
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Abstract
A method of determining a film coating thickness on a substrate including making near-IR spectra of a series of coating thickness or coating weight standards on an appropriate substrate material to match sample material in question, pre-processing the data to prepare it for multivariate calibration methods, performing the multivariate calibration, saving the calibration model in the hand-held near-IR device in an appropriate format, and using the calibration model to predict sample material thickness in question from their near IR spectra.
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