Fan and pencil beams from a common source for x-ray inspection
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United States of America Patent
Stats
-
Feb 20, 2001
Grant Date -
N/A
app pub date -
Nov 24, 1999
filing date -
Nov 30, 1998
priority date (Note) -
In Force
status (Latency Note)
Importance
Abstract
A system and method for inspecting an object, where both a fan beam and a pencil beam of penetrating radiation are used to illuminating the object concurrently. Both beams may be derived from a single source of penetrating radiation. The pencil beam is noncoplanar with the fan beam and may be scanned with respect to the object. Radiation scattered from the pencil beam within the object is detected, and the scatter signal thus generated is used in conjunction with a transmission signal which characterizes attenuation of the fan beam by the object.
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