In-band noise and/or spectral deformation measurement on polarization-multiplexed signals
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United States of America Patent
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Nov 13, 2018
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May 5, 2016
app pub date -
Nov 4, 2015
filing date -
Nov 5, 2014
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Abstract
There is provided a method to discriminate NLE-induced signal deformation from ASE-noise on polarization multiplexed signals, in order to measure the OSNR under NLE conditions and/or characterize the NLE-induced signal deformation. In accordance with one aspect, the method is based on the acquisition of optical spectrum traces when the (data-carrying) optical communication signal is partially or completely extinguished (ASE-noise only), as well as with a live optical communication signal. Comparing traces acquired with different conditions and/or at different dates allows discrimination of the signal contribution, the ASE-noise contribution and the NLE-induced deformations on the SUT.
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