Predicting timing degradations for data signals in an integrated circuit
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United States of America Patent
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Jul 12, 2011
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app pub date -
Jan 24, 2008
filing date -
Jan 24, 2008
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Abstract
A computer-implemented method of predicting timing characteristics within a semiconductor device can include determining configuration information for the semiconductor device and determining a measure of timing degradation for data signals of the semiconductor device according to the configuration information. The measure of timing degradation for the data signals can be output.
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