Semiconductor arrangement and method for making

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United States of America Patent

PATENT NO 11482495
APP PUB NO 20200176382A1
SERIAL NO

16681952

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Abstract

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A method for fabricating a semiconductor arrangement includes removing a portion of a first dielectric layer to form a first recess defined by sidewalls of the first dielectric layer, forming a first conductive layer in the first recess, removing a portion of the first conductive layer to form a second recess defined by the sidewalls of the first dielectric layer, forming a second conductive layer in the second recess, where the second conductive layer contacts the first conductive layer, forming a second dielectric layer over the second conductive layer, removing a portion of the second dielectric layer to form a third recess defined by sidewalls of the second dielectric layer, where the second conductive layer is exposed through the third recess, and forming a third conductive layer in the third recess, where the third conductive layer contacts the second conductive layer.

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Patent Owner(s)

  • TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD.

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Chang, Chih-Wei Hsin-Chu, TW 342 1162
Chen, Pin-Wen Keelung, TW 26 69
Fu, Mei-Hui Hsinchu, TW 13 322
Lee, Hong-Mao Hsinchu, TW 27 79
Lin, Wei-Jung Hsinchu, TW 70 198

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