HDPCVD process and method for improving uniformity of film thickness

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United States of America Patent

PATENT NO 7235496
APP PUB NO 20060063390A1
SERIAL NO

10711512

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Abstract

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A high density plasma chemical vapor deposition (HDPCVD) process is disclosed. First, a first deposition step is performed on a wafer. Then, the wafer is rotated with an angle. A second deposition step is performed for completing the deposition. By the rotation of the wafer, the thin film is formed with a desired uniformity.

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Patent Owner(s)

  • MACRONIX INTERNATIONAL CO., LTD.

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Lu, Chien-Hung Hsinchu, TW 17 67
Su, Chin-Ta Hsinchu, TW 48 95

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