Method for measuring magnetic characteristics, apparatus for measuring magnetic characteristics, and method for manufacturing magnetic recording medium

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United States of America Patent

PATENT NO 11860248
APP PUB NO 20220221531A1
SERIAL NO

17277190

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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A method for measuring magnetic characteristics is the method including applying a first magnetic field to a continuously moving magnetic recording medium to magnetically saturate the magnetic recording medium, applying a first polarized light to a surface of the magnetic recording medium to which the first magnetic field is being applied, and measuring a light polarization state of a first reflected light that is reflected, applying a second magnetic field having an opposite direction of the first magnetic field to the continuously moving magnetic recording medium to magnetically saturate the magnetic recording medium, applying a second polarized light to the surface of the magnetic recording medium to which the second magnetic field is being applied, and measuring a light polarization state of a second reflected light that is reflected, applying a third magnetic field having an opposite direction of the second magnetic field to the continuously moving magnetic recording medium, applying a third polarized light to the surface of the magnetic recording medium to which the third magnetic field is being applied, and measuring a light polarization state of a third reflected light that is reflected, and adjusting a strength of the third magnetic field so that a measurement value of the light polarization state of the third reflected light is a mean value of a measurement value of the light polarization state of the first reflected light and a measurement value of the light polarization state of the second reflected light, and obtaining the strength of the third magnetic field when the measurement value of the light polarization state of the third reflected light becomes equal to the mean value.

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Patent Owner(s)

  • SONY CORPORATION

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Imai, Yasunori Tokyo, JP 2 0
Ono, Akifumi Tokyo, JP 1 0

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