Test compaction using linear-matrix driven scan chains
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United States of America Patent
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Sep 1, 2009
Grant Date -
Nov 25, 2004
app pub date -
Jul 29, 2003
filing date -
May 23, 2003
priority date (Note) -
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Abstract
A scan technique using linear matrix to drive scan chains is used, along with an ATPG, to constraint scan test vectors to be generated through the linear matrix. The linear matrix scan technique reduces the test application time and the amount of test vector data by several orders of magnitude over conventional techniques, without reducing fault coverage.
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