Small test piece polishing apparatus
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United States of America Patent
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Jun 5, 2012
Grant Date -
Apr 8, 2010
app pub date -
Aug 24, 2007
filing date -
Mar 15, 2007
priority date (Note) -
In Force
status (Latency Note)
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Abstract
A small test piece polishing apparatus is provided which is less likely to bend or damage a small test piece, which is superior in working efficiency, and which ensures uniform quality for the small test pieces produced. The small test piece polishing apparatus 1 for polishing a surface of a small test piece 3 having a circular cross section using a string-type member 13 includes string-type member delivery/recovery means 10, abrasive applying means 20, holding/rotating means 30, and pressing/scanning means 40. The abrasive applying means 20 applies an abrasive to the string-type member delivered by the string-type member delivery/recovery means 10. Thereafter, the pressing/scanning means 40 presses the string-type member 13 applied with the abrasive against the small test piece 3 held and rotated by the holding/rotating means 30 to perform scanning, to thereby polish the small test piece 3.
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Cited Art Landscape
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