Optical detector for echelle spectrometer
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United States of America Patent
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Jan 21, 1997
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app pub date -
Jun 7, 1995
filing date -
Jun 7, 1995
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Abstract
A solid-state detector for use in an atomic spectrometer comprises a plurality of arrays of sensing elements, or pixels, each of the arrays being positioned along and on the locations of spectral signals on a focal plane of an echelle grating spectrometer. The sensing elements are positioned along the many diffraction orders presented on a two-dimensional echelle grating focal plane so that at least one element is located at each and every resolution element regardless of global x-y coordinate positioning of the elements or with reference to each other. The result is a series of skewed lines of sensing elements, those lines being in the same shape as the series of diffraction order lines which comprise an echelle spectrum. The solid-state detector is particularly useful in an atomic spectrometer wherein an echelle grating is used to diffract incident radiation such that the various components of the radiation may be observed.
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- 15 United States
- 10 France
- 8 Japan
- 7 China
- 5 Korea
- 2 Other
Patent Owner(s)
- AGILENT TECHNOLOGIES, INC.
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Inventor(s)
Inventor Name | Address | # of filed Patents | Total Citations |
---|---|---|---|
Chien, Ring-Ling | San Jose, CA | 25 | 1751 |
Cooper, III Charles B | Redwood City, CA | 3 | 67 |
Zander, Andrew T | Cupertino, CA | 4 | 82 |
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Surcharge after expiration - Late payment is unavoidable | $700.00 | $350.00 | $175.00 |
Surcharge after expiration - Late payment is unintentional | $1,640.00 | $820.00 | $410.00 |
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