Particle image analyzing apparatus

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United States of America Patent

PATENT NO 7643143
APP PUB NO 20070273878A1
SERIAL NO

11803604

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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A particle image analyzing apparatus for analyzing an image of an imaged particle, the particle image analyzing apparatus comprising: an illuminating unit for providing dark field illumination the a particle; an imaging unit for acquiring capturing an imaged image by imaging the dark field illuminated particle; and an image processing unit for extracting a particle image from the imaged image captured by the imaging unit, based on a threshold value larger than a luminance value substantially corresponding to the background of the particle image, and analyzing the extracted particle image to obtain morphological feature information indicating the morphological feature of the particle; wherein the image processing unit extracts the particle image from the imaged image based on a threshold value larger than a luminance value substantially corresponding to the background of the particle image.

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Patent Owner(s)

  • SYSMEX CORPORATION

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Fujii, Kozo Akashi, JP 25 226
Yamaguchi, Katsuaki Kobe, JP 6 72

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