Particle image analyzing apparatus
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United States of America Patent
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Jan 5, 2010
Grant Date -
Nov 29, 2007
app pub date -
May 15, 2007
filing date -
May 15, 2006
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Abstract
A particle image analyzing apparatus for analyzing an image of an imaged particle, the particle image analyzing apparatus comprising: an illuminating unit for providing dark field illumination the a particle; an imaging unit for acquiring capturing an imaged image by imaging the dark field illuminated particle; and an image processing unit for extracting a particle image from the imaged image captured by the imaging unit, based on a threshold value larger than a luminance value substantially corresponding to the background of the particle image, and analyzing the extracted particle image to obtain morphological feature information indicating the morphological feature of the particle; wherein the image processing unit extracts the particle image from the imaged image based on a threshold value larger than a luminance value substantially corresponding to the background of the particle image.
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- 15 United States
- 10 France
- 8 Japan
- 7 China
- 5 Korea
- 2 Other
Patent Owner(s)
- SYSMEX CORPORATION
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Inventor(s)
Inventor Name | Address | # of filed Patents | Total Citations |
---|---|---|---|
Fujii, Kozo | Akashi, JP | 25 | 226 |
Yamaguchi, Katsuaki | Kobe, JP | 6 | 72 |
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Surcharge after expiration - Late payment is unavoidable | $700.00 | $350.00 | $175.00 |
Surcharge after expiration - Late payment is unintentional | $1,640.00 | $820.00 | $410.00 |
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