Data driving impedance auto-calibration circuit and semiconductor integrated circuit using the same
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United States of America Patent
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Oct 2, 2012
Grant Date -
Mar 31, 2011
app pub date -
Jul 27, 2010
filing date -
Sep 30, 2009
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Abstract
A data driving impedance auto-calibration circuit includes: a detection block configured to calibrate a characteristic voltage generated by detecting an operation characteristic variation of an element, according to a code signal, and generate a calibrated characteristic voltage; a comparison block configured to compare the calibrated characteristic voltage with a reference voltage and output a comparison result signal; and a code calibration block configured to calibrate the code signal according to the comparison result signal.
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