System for detection of flaws by use of microwave radiation
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United States of America Patent
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-
Jan 9, 2001
Grant Date -
N/A
app pub date -
Dec 30, 1998
filing date -
Dec 30, 1998
priority date (Note) -
Expired
status (Latency Note)
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Abstract
Targeted portions of material layered structure is probed by microwave radiation focussed onto the targeted portion by adjustment of antenna position and orientation establishing a single oblique incidence path for reflection of antenna emitted probing radiation. Signal measurements of the radiation along the oblique incidence path is obtained to provide for evaluation and detection of defects in the targeted portion of the structure being probed.
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