Topology-based retirement in a memory system
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United States of America Patent
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Mar 26, 2024
Grant Date -
Aug 11, 2022
app pub date -
Jan 12, 2022
filing date -
Feb 9, 2021
priority date (Note) -
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Abstract
Methods, systems, and devices for topology-based retirement in a memory system are described. In some examples, a memory system or memory device may be configured to evaluate error conditions relative to a physical or electrical organization of a memory array, which may support inferring the presence or absence of defects in one or more structures of a memory device. For example, based on various evaluations of detected errors, a memory system or a memory device may be able to infer a presence of a short-circuit, an open circuit, a dielectric breakdown, or other defects of a memory array that may be related to wear or degradation over time, and retire a portion of a memory array based on such an inference.
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