Method and system for calibrating a measurement device path and for measuring a device under test in the calibrated measurement device path
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United States of America Patent
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Mar 28, 2006
Grant Date -
Mar 18, 2004
app pub date -
Sep 16, 2002
filing date -
Sep 16, 2002
priority date (Note) -
Expired
status (Latency Note)
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Abstract
A method and system of calibrating first and second adapters comprises the steps of calibrating coaxial ports of a vector network analyzer to traceable standards and connecting a symmetrical through circuit path between the coaxial ports. The through circuit path comprises a cascaded combination of the first and second adapters. The first adapter is passive and substantially identical to the second adapter and uncascaded first and second adapters comprise a measurement device path. The through circuit path and the measurement device path have substantially equivalent S-parameters. S-parameters of the through circuit path are measured and then the first and second adapters are characterized based upon the measured S-parameters. The method and system may be applied to two port adapters and devices under test and may also be scaled for multi-port adapters and devices under test.
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