Method of fabricating metal-insulator-semiconductor tunneling contacts using conformal deposition and thermal growth processes

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United States of America

PATENT NO 8901740
SERIAL NO

13352062

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Abstract

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A contact may be fabricated by a method including depositing a dielectric layer on a substrate having a transistor, etching a first opening in the dielectric layer that extends to a source region, forming an insulator on the source region, forming a contact metal on the insulator, the insulator separating the contact metal from the source region, and filling substantially all of the first opening, wherein the contact metal remains separated from the source region after the first opening is filled.

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Patent Owner(s)

  • INTEL CORPORATION

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Chau, Robert S Beaverton, US 514 18980
Dewey, Gilbert Hillsboro, US 439 4094
Kavalieros, Jack Portland, US 270 9067
Metz, Matthew V Portland, US 331 5764
Mukherjee, Niloy Beaverton, US 230 3769

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