Semiconductor integrated circuit device with large-scale memory and controller embedded on one semiconductor chip and method of testing the device
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United States of America Patent
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Oct 20, 1998
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Nov 27, 1996
filing date -
Nov 29, 1995
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Abstract
A semiconductor integrated circuit device comprises, on a semiconductor chip, a large-scale memory as a main memory, a controller for controlling at least inputting data from the outside of the chip to the large-scale memory, and outputting data from the large-scale memory to the outside of the chip, and a self-test circuit for testing the large-scale memory. The self-test circuit includes a rewritable EEPROM, into which a self-test sequence is written. The self-test circuit tests the large-scale memory in accordance with the self-test sequence written in the EEPROM.
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