Integrated circuit tester with compensation for leakage current
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United States of America Patent
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-
Feb 27, 2001
Grant Date -
N/A
app pub date -
May 11, 1999
filing date -
Apr 30, 1997
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
In an integrated circuit tester module, pin electronics circuitry supplies leakage current to a circuit node which is connected to a signal pin of a device under test. The leakage current is compensated by connecting the circuit node to a voltage source at a first potential level, supplying current to the circuit node from a second potential level, and measuring current supplied to the circuit node from the voltage source. The second potential level is selectively varied in a manner such as to reduce the current supplied from the voltage source substantially to zero. The circuit node is then disconnected from the voltage source.
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