Sine-bar gage-blocks and direct reading micrometer adjustment
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United States of America Patent
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-
Jun 28, 1983
Grant Date -
N/A
app pub date -
Dec 15, 1980
filing date -
Dec 15, 1980
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
A set of selectively useable primary gage-blocks displacing plugs of a first sine-bar at increasing degree ranges of angularity, and selectively useable secondary gage-blocks for disposition between a primary block and displaced sine-bar plug for the increase in angularity to degree increments within said primary block range, and combined therewith a second sine-bar and directly reading micrometer adjustment for angular displacement of the secondary sine-bar in degrees and minutes of angularity, the micrometer being comprised of a barrel having a curvilinear index line with axial calibration in degrees and displaced from rotation of an extension screw of uniform pitch, and a thimble with circumferential calibrations in minutes and rotating with the said extension screw to be revolved in reference to said curvilinear index line and thereby extended in decreasing amounts corresponding to the height dimensions required in order to establish sine-bar angularity.
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