Positive resist containing naphthol functionality

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United States of America Patent

PATENT NO 7129016
SERIAL NO

10987540

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Abstract

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Acid-catalyzed positive resist compositions which are imageable with 193 nm radiation are obtained using a polymer having acrylate/methacrylate monomeric units comprising a naphthol ester group. The resist may optionally contain polymer having acrylate/methacrylate monomeric units with fluorine-containing functional groups. The resists containing the polymer having acrylate/methacrylate monomeric units comprising a naphthol ester group have an improved process window, including improved etch resistance and reduced swelling compared to conventional fluorine-containing 193 nm resist.

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Patent Owner(s)

  • INTERNATIONAL BUSINESS MACHINES CORPORATION

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Chen, Kuang-Jung Poughkeepsie, NY 86 989
Khojasteh, Mahmoud Poughkeepsie, NY 40 277
Varanasi, Pushkara Rao Poughkeepsie, NY 39 539

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