Machine tool analysis device and method
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United States of America Patent
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Jan 1, 2008
Grant Date -
Jan 26, 2006
app pub date -
Dec 18, 2003
filing date -
Dec 19, 2002
priority date (Note) -
In Force
status (Latency Note)
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Abstract
The invention relates to a device and method for analysis of a tool (50) e.g. used on a machine tool. A tool detector (5) includes a light emitter (12) and a light receiver (34). Tool (50) when progressed into a beam (20) of light emitted from the emitter (12) will cause a signal from the receiver to change. Circuitry (32) includes a digital signal processor which processes the signal from the receiver and produces an output only if the signal conforms to a predetermined condition. Preferably this predetermined condition could be e.g. a characteristic shape of the signal from the receiver, a change in a value derived from a succession of such signals or a change in the minimum or maximum values of a succession of signals from the receiver.
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