N-wavelength interrogation system and method for multiple wavelength interferometers
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United States of America Patent
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Sep 13, 2016
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Oct 2, 2014
app pub date -
Jan 28, 2014
filing date -
Jan 28, 2013
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Abstract
In an interrogation system for multiple wavelength interferometers a fringe spectrum that includes non-quadrature-spaced radiation-intensity samples is analyzed to obtain a high resolution relative phase measurement of the optical path-length difference associated with the fringe spectrum. The fringe spectrum can be analyzed to obtain a fringe number and a quadrant as well, which can be combined with the relative phase measurement to obtain a high precision measurement of the absolute optical path-length difference. An environmental condition corresponding to the absolute optical path-length difference can be measured using the measurement of the absolute optical path-length difference.
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