Quantum noise process analysis method and apparatus, device, and storage medium

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United States of America Patent

PATENT NO 11893453
APP PUB NO 20210166149A1
SERIAL NO

17174665

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This disclosure describes a quantum noise process analysis method, device, and storage medium, in the field of quantum processing technologies. The method may include performing quantum process tomography (QPT) on a quantum noise process of a target quantum system, to obtain dynamical maps of the quantum noise process, wherein the QPT involves at least one measurement of the target quantum. The method further includes extracting transfer tensor maps (TTMs) of the quantum noise process from the dynamical maps; and analyzing the quantum noise process according to the TTMs. The TTM is used for representing a dynamical evolution of the quantum noise process to reflect the law of evolution of the dynamical maps of the quantum noise process over time. As a result, richer and more comprehensive information about the quantum noise process can be obtained by analyzing the quantum noise process based on the TTM of the quantum noise process than by pure QPT, thereby achieving a more accurate and more comprehensive analysis of the quantum noise process.

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Patent Owner(s)

  • TENCENT TECHNOLOGY (SHENZHEN) COMPANY LIMITED

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Chen, Yuqin Guangdong, CN 310 511
Hsieh, Changyu Guangdong, CN 7 3
Ma, Kaili Guangdong, CN 2 1
Zhang, Shengyu Guangdong, CN 48 15
Zheng, Yicong Guangdong, CN 9 9

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