Rock high-stress high-temperature micro-nano indentation test system

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United States of America Patent

PATENT NO 11415498
SERIAL NO

17070946

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Abstract

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The present disclosure discloses a rock high-stress high-temperature micro-nano indentation test system, comprising: an X, Y, Z three-direction macroscopic adjustment module, an indentation precision loading module, an indentation test module and an indentation data processing module. The rock high-stress high-temperature micro-nano indentation test system further comprise a two-dimensional horizontal stress loading device, a temperature control device and a vacuum device 13. The rock high-stress high-temperature micro-nano indentation test system provided by the present disclosure has distinctive features of modularity and structuralization, and its test results have high accuracy. The rock high-stress high-temperature micro-nano indentation test system is easy to operate, and provides a theoretical and technical system support for testing the mechanical characteristics of the rock under the high-stress and high-temperature environment in the deep region.

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Gao, Yang Wuhan, CN 416 5652
Hu, Dawei Wuhan, CN 26 46
Lu, Jingjing Wuhan, CN 9 11
Shao, Jianfu Wuhan, CN 2 0
Song, Jinliang Wuhan, CN 6 0
Yang, Fanjie Wuhan, CN 4 10
Zhang, Chuanqing Wuhan, CN 5 10
Zhang, Fan Wuhan, CN 880 6217
Zhang, Guoping Wuhan, CN 49 240
Zhou, Hui Wuhan, CN 243 1794
Zhu, Yong Wuhan, CN 151 647

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