Imaging systems, imaging device analysis systems, imaging device analysis methods, and light beam emission methods
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United States of America Patent
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Nov 19, 2013
Grant Date -
May 11, 2006
app pub date -
Oct 27, 2005
filing date -
Apr 5, 2004
priority date (Note) -
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Abstract
Imaging systems, imaging device analysis systems, imaging device analysis methods, and light beam emission methods are described. According to one aspect, an imaging device analysis method includes receiving initial light comprising a plurality of wavelengths of light, filtering some of the wavelengths of the initial light forming a plurality of light beams comprising different wavelengths of light, after the filtering, optically communicating the light beams of the different wavelengths of light to an imaging device, receiving the light beams using the imaging device, and analyzing the imaging device using light, wherein the light beams comprising the different wavelengths of light are emitted beams after the receiving.
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