Fin-shaped semiconductor device

Number of patents in Portfolio can not be more than 2000

United States of America Patent

PATENT NO 7129550
APP PUB NO 20050051825A1
SERIAL NO

10775017

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Abstract

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A semiconductor layer in which a primary part of a FinFET is formed, i.e., a fin has a shape which is long in a direction x and short in a direction y. A width of the fin in the direction y changes on three stages. First, in a channel area between gate electrodes each having a gate length Lg, the width of the fin in the direction y is Wch. Further, the width of the fin in the direction y in a source/drain extension area adjacent to the channel area in the direction x is Wext (>Wch). Furthermore, the width of the fin in the direction y in a source/drain area adjacent to the source/drain extension area in the direction x is Wsd (>Wext).

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Patent Owner(s)

  • KABUSHIKI KAISHA TOSHIBA

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Fujiwara, Makoto Yokohama, JP 145 1512
Hokazono, Akira Sagamihara, JP 55 995
Ishimaru, Kazunari Yokohama, JP 30 743

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