Scan compression circuit and method of design therefor
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United States of America Patent
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Oct 12, 2010
Grant Date -
Oct 16, 2008
app pub date -
May 25, 2007
filing date -
Apr 13, 2007
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Abstract
A scan-based circuit includes a selector that is implemented by multiple observation logics. Each observation logic is coupled to a scan chain to receive data to be supplied to a combinational compressor. Each observation logic is also coupled to a single input line in a corresponding group of input lines of the combinational compressor, to selectively supply data from the coupled scan chain. Each observation logic may be coupled to additional input lines (if present) in the corresponding group. The selector is operable on a per-shift basis in (a) transparent mode wherein data is supplied to all input lines and (b) several direct modes wherein data from only one scan chain is supplied at each compressor output without overlap.
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- 15 United States
- 10 France
- 8 Japan
- 7 China
- 5 Korea
- 2 Other
Patent Owner(s)
- SYNOPSYS, INC.
International Classification(s)
Inventor(s)
Inventor Name | Address | # of filed Patents | Total Citations |
---|---|---|---|
Kapur, Rohit | Cupertino, US | 44 | 651 |
Ramnath, Sanjay | San Jose, US | 1 | 32 |
Waicukauski, John A | Tualatin, US | 26 | 705 |
Williams, Thomas W | Boulder, US | 30 | 746 |
Wohl, Peter | Williston, US | 30 | 524 |
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