Method and apparatus for an embedded time domain reflectometry test
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United States of America Patent
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Dec 29, 2009
Grant Date -
Jun 8, 2006
app pub date -
Nov 23, 2004
filing date -
Nov 23, 2004
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Abstract
A method and apparatus for testing an integrated circuit interconnect comprises an IC having circuitry embedded in the IC capable of providing a pseudo time domain reflectometry test by launching a test transition onto the interconnect and capturing a reflection of the test transition.
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