Self calibration method and apparatus for correcting offset angle in a photon counting computed tomography system
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United States of America Patent
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Nov 8, 2022
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Sep 22, 2022
app pub date -
Mar 19, 2021
filing date -
Mar 19, 2021
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Abstract
An apparatus, system and method for calibrating an x-ray apparatus including acquiring sinogram data by scanning a symmetrical phantom using a plurality of detector channels; generating mirror-copied sinogram data by mirror-copying at least one of first sinogram data and second sinogram data of the acquired sinogram data, wherein the first sinogram data and the second sinogram data are generated by dividing the sinogram data at a center detector channel of the plurality of detector channels; outputting a first reconstructed image by reconstructing the mirror-copied sinogram data; and determining a calibration parameter based on the first reconstructed image.
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