Selecting scan test/TAP with FF receiving lock in and update-IR
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United States of America Patent
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May 31, 2011
Grant Date -
Aug 12, 2010
app pub date -
Apr 20, 2010
filing date -
Apr 28, 2000
priority date (Note) -
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status (Latency Note)
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Abstract
A process of selecting alternative test circuitry within an integrated circuit enables a test access port. Scan test instruction data is loaded into an instruction register of a test access port TAP, the instruction data including information for selecting the alternative test circuitry. An Update-IR instruction update operation is performed at the end of the loading to output scan test control signals from the instruction register. A lockout signal is changed to an active state to disable the test access port and enable scan test circuits.
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