Method for estimating a life of apparatus under narrow-band random stress variation

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United States of America Patent

PATENT NO 6532421
APP PUB NO 20010034581A1
SERIAL NO

09727703

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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A method for estimating the life of an apparatus under a random stress amplitude variation, involving determining a probability density function of a cumulated damage quantity and estimating the life of the apparatus on the basis of the probability density function, characterized by: approximating a damage coefficient indicative of a damage quantity per unit by a linear expression when the random stress amplitude variation is in a narrow band; and representing the random stress amplitude variation .sigma.(t)(instantaneous) in terms of the sum of a time averaged value .sigma.(t)(mean) and a stochastic variation .sigma.'.

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Patent Owner(s)

  • TOHO GAS CO., LTD.

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Miwa, Masataka Nagoya, JP 1 15

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