Infrared imaging element

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United States of America Patent

PATENT NO 8415622
APP PUB NO 20120228497A1
SERIAL NO

13414941

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Abstract

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An infrared imaging element according to an embodiment includes: a semiconductor substrate including a stacked structure of a silicon first substrate, and a first insulation film, first cavities being provided on a surface of the first substrate; an infrared detection unit provided in the semiconductor substrate and including, detection cells provided respectively over the first cavities, each of the detection cells having diodes and a second insulation film, the first insulation film converting incident infrared rays to heat, the diodes converting the heat obtained by the first insulation film to an electric signal, a third insulation film having a top face located at a greater distance from the semiconductor substrate as compared with a top face of the second insulation film; and a second substrate provided over the third insulation film. A second cavity is formed between the second substrate and the infrared detection unit.

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Patent Owner(s)

  • KABUSHIKI KAISHA TOSHIBA

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Fujiwara, Ikuo Yokohama, JP 45 224
Funaki, Hideyuki Tokyo, JP 147 1894
Honda, Hiroto Yokohama, JP 54 593
Ishii, Koichi Kawasaki, JP 78 541
Kwon, Honam Kawasaki, JP 59 263
Ogata, Masako Yokohama, JP 8 36
Sasaki, Keita Yokohama, JP 71 170
Suzuki, Kazuhiro Tokyo, JP 431 5447
Ueno, Risako Tokyo, JP 52 536
Yagi, Hitoshi Yokohama, JP 34 127

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