Method for programming and/or testing for correct functioning of an electronic circuit
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United States of America Patent
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Aug 14, 2007
Grant Date -
Nov 20, 2003
app pub date -
Feb 3, 2003
filing date -
Feb 1, 2002
priority date (Note) -
Expired
status (Latency Note)
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Abstract
Proposed is a method for programming and/or testing for the correct functioning of an electronic circuit, and a corresponding device, which is used to efficiently program and test electronic circuits combined on a wafer, prior to their separation. For this purpose, a bus allowing the individual electronic circuits to be sequentially tested is positioned on the wafer. Each electronic circuit is assigned an address for the bus, using a hardware code. The address is deactivated after completion of the functionality and testing method.
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