Method for determining relative degrees of reflectance of a measurement surface

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United States of America Patent

PATENT NO 11774360
SERIAL NO

17282422

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Abstract

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A method for determining relative degrees of reflectance of a measurement surface, having the method steps of applying measurement radiation to the measurement surface, such that a measurement spot is produced on the management surface, moving the measurement spot along at least a first straight measurement spot path, over the measurement surface in accordance with a first path movement and along a second straight measurement spot path with a second path movement, recording a first and second image sets of a plurality of locally resolved images of the measurement surface during the first path movement and the second path movement. An evaluation is carried out at intersection points, whose location points on the management surface are defined by evaluation lines, wherein a first group of straight evaluation lines within the first measurement path region and a second group of straight evaluation lines within the second measurement path region are predefined and/or determined. The evaluation lines of the first group are parallel to the first measurement spot path and the evaluation lines of the second group are parallel to the second measurement spot path, and each first group evaluation line has an intersection point with each second group evaluation line. For each intersection point, a maximum greyscale value is determined, and relative degrees of reflectance of the measurements surface are determined at least on a subset of the intersection points, depending on these greyscale values.

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Patent Owner(s)

Patent OwnerAddress
FRAUNHOFER-GESELLSCHAFT ZUR FORDERUNG DER ANGEWANDTEN FORSCHUNG E VHANSASTRASSE 27C MUNICH 80686

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Bern, Gregor Freiburg, DE 3 1
Heimsath, Anna Freiburg, DE 3 1
Nitz, Peter Freiburg, DE 11 44
Schöttl, Peter Freiburg, DE 1 0

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