Centralized test apparatus for ATM exchange system

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United States of America Patent

PATENT NO 5887000
SERIAL NO

08966574

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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A centralized test apparatus is provided for an ATM exchange system. The test apparatus monitors cells transmitted through a specified line connected to an office unit of the exchange system or through a specified path in the exchange system, and measures the traffic of the specified line or path. The test apparatus has an instruction unit for issuing an instruction to test a cell transmitted through the specified line or path, a destination changer arranged in the office unit, for changing the destination header of the cell according to an instruction from the instruction unit, so that the destination header indicates a tester, a switching unit for guiding the cell to the tester according to the header, and the tester fixed in the exchange system, to centrally monitor and test the cell.

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Patent Owner(s)

  • FUJITSU LIMITED

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Adachi, Hiroshi Fukuoka, JP 111 1327
Eguchi, Nobuhiko Fukuoka, JP 9 115
Kudo, Hiroyuki Fukuoka, JP 35 721

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