Importance

Loading Importance Indicators...

Abstract

A semiconductor LSI circuit provided with a scan circuit includes: to-be-tested combinational logic circuits; scan circuits adjacent to and disposed alternately with the combinational logic circuits; scan elements, which form the scan circuits; a first selector inserted in a first scan circuit scan and connects a first group of scan elements and a second group of scan elements; a second selector inserted in a second scan circuits and connects a third group of scan elements and a fourth group of scan elements; a first route provided in the first group of scan elements and extending from a scanning output terminal of a scan element; and a second route provided in a third group of scan elements and extending from the scanning output terminal of a scan element. The first selector selects either the first route or the second route.

Loading the Abstract Image...

First Claim