Semiconductor device having a temperature detection circuit
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United States of America Patent
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Feb 8, 1994
Grant Date -
N/A
app pub date -
Aug 30, 1991
filing date -
Aug 30, 1990
priority date (Note) -
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Abstract
A semiconductor device is provided with an automatic voltage switching circuit which applies an internal, reduced power voltage to an internal other than when a burn-in test is performed. The semiconductor device comprises a temperature detection circuit for detecting a predetermined temperature used for the burn-in test and a switch circuit for applying the external power voltage to the internal circuit when the predetermined temperature is detected.
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