Semiconductor device including anti-fuse circuit, and method of writing address to anti-fuse circuit

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United States of America Patent

PATENT NO 7952950
APP PUB NO 20090109790A1
SERIAL NO

12289196

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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An anti-fuse circuit according to the present invention includes an anti-fuse element that holds data in a nonvolatile manner and a latch circuit that temporarily holds data to be written to the anti-fuse element. The writing to the latch circuit can be performed in the order of nanoseconds, and thus, even when the defective addresses respectively different are written in a plurality of chips, a writing process to the latch circuit can be completed in a very short period of time. Thereby, an actual process for writing to the anti-fuse element can be performed in parallel for the chips, and as a result, the process for writing to the anti-fuse element can be performed at high speed.

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Patent Owner(s)

  • LONGITUDE SEMICONDUCTOR S.A.R.L.

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Miyatake, Shinichi Tokyo, JP 52 508
Ogawa, Sumio Tokyo, JP 23 186

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